8 to 12GHz Lens Material Test System

Lens Material Test System 8-12GHz This product is a professional Lens Material Test System designed for non contact material characterization in the X band frequency range. The system operates from 8GHz to 12GHz and is built primarily from aluminum for light weight and good durability. As a Lens Material Test System, it uses the free space method to measure electromagnetic properties of materials without damaging the samples. This non contact approach is ideal for valuable components or production units where sample integrity must be preserved. The system includes a lens, a feed antenna, a rail with digital scale, and a calibration plate. The lens is removable, and the distance between the feed and the lens can be adjusted along the rail. This flexibility allows users to optimize the setup for different sample sizes and measurement requirements. The core measurement capabilities of this system cover key material properties in the X band. Users can characterize dielectric constant, per…